[IEEE IMTC/2002. 19th IEEE Instrumentation and Measurement...

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[IEEE IMTC/2002. 19th IEEE Instrumentation and Measurement Technology Conference - Anchorage, AK, USA (21-23 May 2002)] IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) - Efficient identification of third order Volterra models using interpolation techniques

Nemeth, J.G., Schoukens, J.
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Volume:
2
Year:
2002
Language:
english
DOI:
10.1109/imtc.2002.1007113
File:
PDF, 514 KB
english, 2002
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