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[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - Lithography aware critical area estimation and yield analysis
Vijayakumar, Priyamvada, Suresh, Vikram B., Kundu, SandipYear:
2011
Language:
english
DOI:
10.1109/test.2011.6139152
File:
PDF, 508 KB
english, 2011