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[IEEE 1999 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (18-21 Oct. 1999)] 1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460) - Hot-carrier degradation evolution in deep submicrometer CMOS technologies
Bravaix, A.Year:
1999
Language:
english
DOI:
10.1109/irws.1999.830589
File:
PDF, 959 KB
english, 1999