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[IEEE 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2011.11.7-2011.11.10)] 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Statistical aging analysis with process variation consideration
Han, Sangwoo, Choung, Joohee, Kim, Byung-Su, Lee, Bong Hyun, Choi, Hungbok, Kim, JuhoYear:
2011
Language:
english
DOI:
10.1109/iccad.2011.6105362
File:
PDF, 1.12 MB
english, 2011