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[IEEE 53rd ARFTG Conference Digest - Anaheim, CA, USA (1999.06.17-1999.06.18)] 53rd ARFTG Conference Digest - Active Device Characterization&Evaluation Using a Functional Representation of Measured Load Pull Data
Staudinger, Joe, Driver, TimYear:
1999
Language:
english
DOI:
10.1109/arftg.1999.327334
File:
PDF, 69 KB
english, 1999