[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA (2011.9.20-2011.9.22)] 2011 IEEE International Test Conference - Wafer probe test cost reduction of an RF/A device by automatic testset minimization — A case study
Drmanac, Dragoljub, Laisne, M., Wang, Li C.Year:
2011
Language:
english
DOI:
10.1109/test.2011.6139143
File:
PDF, 2.15 MB
english, 2011