Electromigration in Al thin films induced by surface...

IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control 1999 / 07 Vol. 46; Iss. 4

Electromigration in Al thin films induced by surface acoustic waves: application to imaging

Tucoulou, R., Brunel, M., Roshchupkin, D.V., Schelokov, I.A., Colin, J., Grilhe, J.
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Volume:
46
Language:
english
Journal:
IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control
DOI:
10.1109/58.775650
Date:
July, 1999
File:
PDF, 1005 KB
english, 1999
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