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[IEEE 2007 69th ARFTG Conference - Honolulu, HI, USA (2007.06.8-2007.06.8)] 2007 69th ARFTG Conference - A bilateral comparison of on-wafer S-parameter measurements at millimeter wavelengths
Clarke, Roland G., Quraishi, Jemeela, Ridler, Nick M.Year:
2007
Language:
english
DOI:
10.1109/arftg.2007.5456342
File:
PDF, 5.43 MB
english, 2007