![](/img/cover-not-exists.png)
[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Faster defect localization in nanometer technology based on defective cell diagnosis
Manish Sharma,, Wu-Tung Cheng,, Ting-Pu Tai,, Cheng, Y.S., Will Hsu,, Chen Liu,, Reddy, Sudhakar M., Mann, AlbertYear:
2007
Language:
english
DOI:
10.1109/test.2007.4437604
File:
PDF, 839 KB
english, 2007