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[IEEE International Symposium on Electromagnetic Compatibility - Boston, MA, USA (18-22 Aug. 2003)] 2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) - A method to display and measure reflection and absorption loss in electromagnetic shields
Badic, M., Marinescu, M.-J.Volume:
2
Year:
2003
Language:
english
DOI:
10.1109/isemc.2003.1236655
File:
PDF, 217 KB
english, 2003