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[IEEE IEEE International Test Conference - (ITC) - Baltimore, MD, USA (17-21 Oct. 1993)] Proceedings of IEEE International Test Conference - (ITC) - Differential virtual instrumentation with continuously variable scale

Dinteman, B.J., Botsford, P.
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Year:
1993
Language:
english
DOI:
10.1109/test.1993.470611
File:
PDF, 843 KB
english, 1993
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