[IEEE IEEE International Test Conference - (ITC) - Baltimore, MD, USA (17-21 Oct. 1993)] Proceedings of IEEE International Test Conference - (ITC) - Differential virtual instrumentation with continuously variable scale
Dinteman, B.J., Botsford, P.Year:
1993
Language:
english
DOI:
10.1109/test.1993.470611
File:
PDF, 843 KB
english, 1993