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[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - Improving test compression by retaining non-pivot free variables in sequential linear decompressors
Muthyala, Sreenivaas S., Touba, Nur A.Year:
2012
Language:
english
DOI:
10.1109/test.2012.6401557
File:
PDF, 247 KB
english, 2012