[IEEE 23rd European Microwave Conference, 1993 - Madrid, Spain (1993.10.4-1993.10.6)] 23rd European Microwave Conference, 1993 - Effects of gate recess depth on very high performance 0.1 mm GaAs MESFET's
Moore, Karen E., East, Jack R., Haddad, George I., Brock, TimYear:
1993
Language:
english
DOI:
10.1109/euma.1993.336800
File:
PDF, 2.62 MB
english, 1993