[IEEE 2012 IEEE 62nd Electronic Components and Technology...

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[IEEE 2012 IEEE 62nd Electronic Components and Technology Conference (ECTC) - San Diego, CA, USA (2012.05.29-2012.06.1)] 2012 IEEE 62nd Electronic Components and Technology Conference - Assembly process and reliability assessment of TSV/RDL/IPD interposer with multi-chip-stacking for 3D IC integration SiP

Zhan, Chau-Jie, Tzeng, Pei-Jer, Lau, John H., Dai, Ming-Ji, Chien, Heng-Chieh, Lee, Ching-Kuan, Wu, Shang-Tsai, Kao, Kuo-Shu, Huang, Shin-Yi, Fan, Chia-Wen, Chung, Su-Ching, Huang, Yu-Wei, Lin, Yu-Min
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Year:
2012
Language:
english
DOI:
10.1109/ectc.2012.6248883
File:
PDF, 2.08 MB
english, 2012
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