[IEEE 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Marina Bay Sands, Singapore (2014.6.30-2014.7.4)] Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Improvement of 3D current mapping by coupling magnetic microscopy and X-Ray computed tomography
Courjault, Nicolas, Infante, Fulvia, Bley, Vincent, Lebey, Thierry, Perdu, PhilippeYear:
2014
DOI:
10.1109/ipfa.2014.6898141
File:
PDF, 3.64 MB
2014