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Exploration of yttria films as gate dielectrics in sub-50 nm carbon nanotube field-effect transistors
Ding, Li, Zhang, Zhiyong, Su, Jun, Li, Qunqing, Peng, Lian-MaoVolume:
6
Language:
english
Journal:
Nanoscale
DOI:
10.1039/c4nr03475a
Date:
August, 2014
File:
PDF, 1.30 MB
english, 2014