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Evaluation of Recent Technologies of Nonvolatile RAM
Nuns, Thierry, Duzellier, Sophie, Bertrand, Jean, Hubert, Guillaume, Pouget, Vincent, Darracq, FrÉdÉric, David, Jean-Pierre, Soonckindt, SabineVolume:
55
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2008.920255
Date:
August, 2008
File:
PDF, 1.72 MB
english, 2008