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[IEEE Comput. Soc. Press 1994 IEEE Symposium on Advanced Research in Asynchronous Circuits and Systems - Salt Lake City, UT, USA (3-5 Nov. 1994)] Proceedings of 1994 IEEE Symposium on Advanced Research in Asynchronous Circuits and Systems - Partial scan test for asynchronous circuits illustrated on a DCC error corrector
Roncken, M.Year:
1994
Language:
english
DOI:
10.1109/async.1994.656318
File:
PDF, 1.10 MB
english, 1994