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Effects of electrical stress parameters on polarization loss in ferroelectric P(L)ZT thin film capacitors
Khamankar, R.B., Jiyoung Kim,, Sudhama, C., Bo Jiang,, Lee, J.C.Volume:
16
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/55.372491
Date:
April, 1995
File:
PDF, 314 KB
english, 1995