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[IRE 1968 International Electron Devices Meeting - ()] 1968 International Electron Devices Meeting - Sub-nanosecond radiative lifetime measurements using mode locked lasers
Merkelo, H., Hartman, S.R., Singhal, G.S., Mar, T.Year:
1968
Language:
english
DOI:
10.1109/iedm.1968.187964
File:
PDF, 106 KB
english, 1968