[IEEE Annual on Reliability and Maintainability Symposium - Los Angeles, CA, USA (23-25 Jan. 1990)] Annual Proceedings on Reliability and Maintainability Symposium - A graphical language for reliability model generation
Howell, S.V., Bavuso, S.J., Haley, P.J.Year:
1990
Language:
english
DOI:
10.1109/arms.1990.68003
File:
PDF, 568 KB
english, 1990