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Fast X-ray detection systems based on GaAs diodes grown by LPE
Rente, C., Lauter, J., Engels, R., Reinartz, R., Apetz, R., Luth, H.Volume:
44
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.603781
Date:
June, 1997
File:
PDF, 376 KB
english, 1997