[IEEE 2012 International Conference on Recent Trends in Information Technology (ICRTIT) - Chennai, Tamil Nadu, India (2012.04.19-2012.04.21)] 2012 International Conference on Recent Trends in Information Technology - Analytical inspection for Replica Management in WANET using Distributed Spanning Tree
Baskaran, R., Victer Paul, P., Dhavachelvan, P.Year:
2012
Language:
english
DOI:
10.1109/icrtit.2012.6206827
File:
PDF, 258 KB
english, 2012