![](/img/cover-not-exists.png)
[IEEE 2010 15th IEEE European Test Symposium (ETS) - Praha, Czech Republic (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - A low-cost built-in self-test scheme for an array of memories
Huang, Yu-Jen, Chou, Che-Wei, Li, Jin-FuYear:
2010
Language:
english
DOI:
10.1109/etsym.2010.5512779
File:
PDF, 372 KB
english, 2010