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[IEEE 2010 11th Latin American Test Workshop - LATW - Punta del Este, Uruguay (2010.03.28-2010.03.31)] 2010 11th Latin American Test Workshop - Functional test generation for DMA controllers
Grosso, M., Perez H., W. J., Ravotto, D., Sanchez, E., Reorda, M. Sonza, Medina, J. VelascoYear:
2010
Language:
english
DOI:
10.1109/latw.2010.5550334
File:
PDF, 203 KB
english, 2010