The Effect of Drain/Gate Bias on Electromechanical Coupling Effect in Accelerometer Based on MESFET
Xue, Chenyang, Tan, Zhenxin, Shi, Weili, Liu, Jun, Zhang, Binzhen, Xiong, Jijun, Zhang, WendongVolume:
11
Language:
english
Journal:
IEEE Sensors Journal
DOI:
10.1109/jsen.2010.2071379
Date:
February, 2011
File:
PDF, 550 KB
english, 2011