[IEEE 2007 IEEE Radiation Effects Data Workshop - (2007.07.23-2007.07.27)] 2007 IEEE Radiation Effects Data Workshop - Bipolar Phototransistors Reliability Assessment for Space Applications
Gilard, O., Quadri, G., Spezzigu, P., Roux, J.L.Year:
2007
Language:
english
DOI:
10.1109/redw.2007.4342545
File:
PDF, 332 KB
english, 2007