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[IEEE 2007 IEEE Radiation Effects Data Workshop - (2007.07.23-2007.07.27)] 2007 IEEE Radiation Effects Data Workshop - Bipolar Phototransistors Reliability Assessment for Space Applications

Gilard, O., Quadri, G., Spezzigu, P., Roux, J.L.
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Year:
2007
Language:
english
DOI:
10.1109/redw.2007.4342545
File:
PDF, 332 KB
english, 2007
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