[IEEE 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2013.11.18-2013.11.21)] 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Bayesian Model Fusion: A statistical framework for efficient pre-silicon validation and post-silicon tuning of complex analog and mixed-signal circuits
Li, Xin, Wang, Fa, Sun, Shupeng, Gu, ChenjieYear:
2013
Language:
english
DOI:
10.1109/iccad.2013.6691204
File:
PDF, 711 KB
english, 2013