[IEEE 2014 72nd Annual Device Research Conference (DRC) -...

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[IEEE 2014 72nd Annual Device Research Conference (DRC) - Santa Barbara, CA, USA (2014.6.22-2014.6.25)] 72nd Device Research Conference - Detection of the conductive filament growth direction in resistive memories

Yalon, E., Kalaev, D., Gavrilov, A., Cohen, S., Riess, I., Ritter, D.
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Year:
2014
Language:
english
DOI:
10.1109/drc.2014.6872415
File:
PDF, 198 KB
english, 2014
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