[IEEE 2009 10th Annual Non-Volatile Memory Technology...

  • Main
  • [IEEE 2009 10th Annual Non-Volatile...

[IEEE 2009 10th Annual Non-Volatile Memory Technology Symposium (NVMTS 2009) - Portland, OR (2009.10.25-2009.10.28)] 2009 10th Annual Non-Volatile Memory Technology Symposium (NVMTS) - Analysis of trap mechanisms responsible for Random Telegraph Noise and erratic programming on sub-50nm floating gate flash memories

Seidel, K., Hoffmann, R., Lohr, D.A., Melde, T., Czernohorsky, M., Paul, J., Beug, M.F., Beyer, V.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2009
Language:
english
DOI:
10.1109/nvmt.2009.5429788
File:
PDF, 4.18 MB
english, 2009
Conversion to is in progress
Conversion to is failed