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[IEEE 2009 10th Annual Non-Volatile Memory Technology Symposium (NVMTS 2009) - Portland, OR (2009.10.25-2009.10.28)] 2009 10th Annual Non-Volatile Memory Technology Symposium (NVMTS) - Analysis of trap mechanisms responsible for Random Telegraph Noise and erratic programming on sub-50nm floating gate flash memories
Seidel, K., Hoffmann, R., Lohr, D.A., Melde, T., Czernohorsky, M., Paul, J., Beug, M.F., Beyer, V.Year:
2009
Language:
english
DOI:
10.1109/nvmt.2009.5429788
File:
PDF, 4.18 MB
english, 2009