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Reduced invasiveness of noncontact electrooptic probes in millimeter-wave optoelectronic characterization
Zeng, A., Shah, S.A., Jackson, M.K.Volume:
44
Language:
english
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/22.508652
Date:
July, 1996
File:
PDF, 380 KB
english, 1996