[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - SPICE simulations of data path timing margins after dielectric breakdown from gate-to-drain using accurate equivalent circuit models
Cakici, Riza Tamer, Nicollian, P. E., Chancellor, C. A.Year:
2012
Language:
english
DOI:
10.1109/irps.2012.6241888
File:
PDF, 348 KB
english, 2012