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[IEEE 2000 International Symposium on Electromagnetic Compatibility (EMC 2000) - Washington, DC, USA (21-25 Aug. 2000)] IEEE International Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.00CH37016) - Geometrically extended UTD compared to the classical UTD

Sturm, A., Gonschorek, K.-H., West, G.
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Volume:
2
Year:
2000
Language:
english
DOI:
10.1109/isemc.2000.874727
File:
PDF, 542 KB
english, 2000
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