[IEEE 2008 IEEE International Conference on RFID (IEEE RFID 2008) - Las Vegas, NV, USA (2008.04.16-2008.04.17)] 2008 IEEE International Conference on RFID - Engineering RFID systems through Electromagnetic Modeling
Gakhar, Sudhanshu, Feldkamp, Joseph, Perkins, Mark, Sun, Rensheng, Reddy, C. JYear:
2008
Language:
english
DOI:
10.1109/rfid.2008.4519346
File:
PDF, 567 KB
english, 2008