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[IEEE 2014 IEEE 32nd VLSI Test Symposium (VTS) - Napa, CA, USA (2014.04.13-2014.04.17)] 2014 IEEE 32nd VLSI Test Symposium (VTS) - Fault simulation with test switching for static test compaction
Pomeranz, IrithYear:
2014
Language:
english
DOI:
10.1109/VTS.2014.6818738
File:
PDF, 190 KB
english, 2014