[IEEE 2012 34th International Conference on Software Engineering (ICSE) - Zurich, Switzerland (2012.06.2-2012.06.9)] 2012 34th International Conference on Software Engineering (ICSE) - Efficient reuse of domain-specific test knowledge: An industrial case in the smart card domain
Devos, Nicolas, Ponsard, Christophe, Deprez, Jean-Christophe, Bauvin, Renaud, Moriau, Benedicte, Anckaerts, GuyYear:
2012
Language:
english
DOI:
10.1109/icse.2012.6227107
File:
PDF, 335 KB
english, 2012