[IEEE 2002 International Test Conference - Baltimore, MD,...

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[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - System manufacturing test cost model

Williams, D., Ambler, A.P.
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Year:
2002
Language:
english
DOI:
10.1109/test.2002.1041798
File:
PDF, 465 KB
english, 2002
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