Modeling of charge trapping induced threshold-voltage...

IEEE Electron Device Letters 2006 / 06 Vol. 27; Iss. 6

Modeling of charge trapping induced threshold-voltage instability in high-/spl kappa/ gate dielectric FETs

Yang Liu,, Shanware, A., Colombo, L., Dutton, R.
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Volume:
27
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2006.874760
Date:
June, 2006
File:
PDF, 171 KB
english, 2006
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