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[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - A 65nm CMOS SOC Technology Featuring Strained Silicon Transistors for RF Applications
Post, I., Akbar, M., Curello, G., Gannavaram, S., Hafez, W., Jalan, U., Komeyli, K., Lin, J., Lindert, N., Park, J., Rizk, J., Sacks, G., Tsai, C., Yeh, D., Bai, P., Jan, C.-H.Year:
2006
Language:
english
DOI:
10.1109/iedm.2006.346816
File:
PDF, 2.92 MB
english, 2006