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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Visualization and damage due to nano-dendrite defects in metal-insulator-metal capacitors
Lieyi Sheng,, Snyder, Eric, Steidley, Shane, Sierra, Anna, Glines, EddieYear:
2008
Language:
english
DOI:
10.1109/relphy.2008.4558970
File:
PDF, 1.23 MB
english, 2008