[IEEE 2007 IEEE International Conference on Image Processing - San Antonio, TX, USA (2007.09.16-2007.10.19)] 2007 IEEE International Conference on Image Processing - MuFeSaC: Learning When to Use Which Feature Detector
Sukumar, Sreenivas R., Page, David L., Bozdogan, Hamparsum, Koschan, Andreas F., Abidi, Mongi A.Year:
2007
Language:
english
DOI:
10.1109/icip.2007.4379543
File:
PDF, 720 KB
english, 2007