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[IEEE 2013 International Conference on Noise and Fluctuations (ICNF) - Montpellier, France (2013.06.24-2013.06.28)] 2013 22nd International Conference on Noise and Fluctuations (ICNF) - 1/f Noise of accumulation mode p- and n-MOSFETs
Gaubert, Philippe, Teramoto, Akinobu, Ohmi, Tadahiro, Sugawa, ShigetoshiYear:
2013
Language:
english
DOI:
10.1109/icnf.2013.6578879
File:
PDF, 401 KB
english, 2013