[IEEE International Electron Devices Meeting. IEDM Technical Digest - Washington, DC, USA (7-10 Dec. 1997)] International Electron Devices Meeting. IEDM Technical Digest - Embedded DRAM technologies
Ishiuchi, H., Yoshida, T., Takato, H., Tomioka, K., Matsuo, K., Momose, H., Sawada, S., Yamazaki, K., Maeguchi, K.Year:
1997
Language:
english
DOI:
10.1109/iedm.1997.649449
File:
PDF, 397 KB
english, 1997