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[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Integration of high-performance SiGe:C HBTs with thin-film SOI CMOS
Rucker, H., Hemernann, B., Barth, R., Bolze, D., Drews, J., Fursenko, O., Grabolla, T., Haak, U., Hoppner, W., Knoll, D., Marschmeyer, S., Mohapatra, N., Richter, H.H., Schley, P., Schmidt, D., TillacYear:
2004
Language:
english
DOI:
10.1109/iedm.2004.1419120
File:
PDF, 229 KB
english, 2004