[IEEE 2010 International SoC Design Conference (ISOCC 2010) - Incheon, Korea (South) (2010.11.22-2010.11.23)] 2010 International SoC Design Conference - Impact of low-doped substrate areas on the reliability of circuits subject to EFT events
Secareanu, Radu, Hartin, Olin, Feddeler, Jim, Moseley, Richard, Shepherd, John, Vrignon, Bertrand, Yang, Jian, Li, Qiang, Zhao, Hongwei, Li, Waley, Wei, Linpeng, Salman, Emre, Wang, Richard, Blomberg,Year:
2010
Language:
english
DOI:
10.1109/socdc.2010.5682984
File:
PDF, 662 KB
english, 2010