[IEEE 9th International Symposium on the Physical and...

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[IEEE 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (8-12 July 2002)] Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) - Failure analysis tailored to demand a business model for high tech service

Boit, C.
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Year:
2002
Language:
english
DOI:
10.1109/ipfa.2002.1025603
File:
PDF, 1.12 MB
english, 2002
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