[IEEE 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (8-12 July 2002)] Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) - Failure analysis tailored to demand a business model for high tech service
Boit, C.Year:
2002
Language:
english
DOI:
10.1109/ipfa.2002.1025603
File:
PDF, 1.12 MB
english, 2002