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[IEEE 2007 IEEE International Conference on Microelectronic Test Structures - Bunkyo-ku, Japan (2007.03.19-2007.03.22)] 2007 IEEE International Conference on Microelectronic Test Structures - Accurate Inductance De-embedding Technique for Scalable Inductor Models
Blaschke, Volker, Victory, JamesYear:
2007
Language:
english
DOI:
10.1109/icmts.2007.374493
File:
PDF, 3.70 MB
english, 2007