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[IEEE Comput. Soc. Press 1989 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers - Santa Clara, CA, USA (5-9 Nov. 1989)] 1989 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers - SPECS simulation validation with efficient transient sensitivity computation
Nguyen, T.V., Feldmann, P., Director, S.W., Rohrer, R.A.Year:
1989
DOI:
10.1109/iccad.1989.76947
File:
PDF, 378 KB
1989