Wafer-Level Modular Testing of Core-Based SoCs

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2007 / 10 Vol. 15; Iss. 10

Wafer-Level Modular Testing of Core-Based SoCs

Bahukudumbi, Sudarshan, Chakrabarty, Krishnendu
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Volume:
15
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2007.903943
Date:
October, 2007
File:
PDF, 864 KB
english, 2007
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