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Atomistic modeling of metallic nanowires in silicon
Ryu, Hoon, Lee, Sunhee, Weber, Bent, Mahapatra, Suddhasatta, Hollenberg, Lloyd C. L., Simmons, Michelle Y., Klimeck, GerhardVolume:
5
Year:
2013
Language:
english
Journal:
Nanoscale
DOI:
10.1039/c3nr01796f
File:
PDF, 747 KB
english, 2013